The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Aug. 08, 2023
Applicant:

Sap SE, Walldorf, DE;

Inventor:

Lamine Rihani, Sartrouville, FR;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 9/44 (2018.01); G06F 11/36 (2025.01); G06F 11/3668 (2025.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3684 (2013.01); G06F 11/36 (2013.01); G06F 16/215 (2019.01); G06F 16/254 (2019.01);
Abstract

Methods, software, and systems for generating intelligent data reports include obtaining initial test outputs from test case scenarios defined for the data processing application. Instructions are provided to a user to execute user-defined tests and to obtain a particular test output from the test outputs. The instructions are provided without providing instructions to the user for input values for parameters to be used for obtaining the particular test outputs. The user-defined tests are performed at the data processing application when associated with a test data source. Data is obtained from the executed user-defined tests at the data processing application. A data analysis is performed over the obtained data to evaluate quality of executions of services provided by the data processing application. A quality status is obtained for the services provided by the data processing application.


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