The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Sep. 09, 2024
Samsung Electronics Co., Ltd., Suwon-si, KR;
Keunseo Kim, Suwon-si, KR;
Jaecheol Lee, Suwon-si, KR;
Sangkyu Park, Suwon-si, KR;
Sangdo Park, Suwon-si, KR;
Dokyoung Kim, Suwon-si, KR;
Minkyu Yang, Suwon-si, KR;
Young Lee, Suwon-si, KR;
Jinsic Jang, Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A method for verifying reliability of a test for products performed by test equipment includes: receiving result images generated from preprocessing of result data of the test, the result data of the test including labels for a plurality of scale levels and the received result images including first result images belonging to a first scale level of the plurality of scale levels and second result images belonging to a second scale level of the plurality of scale levels; making a first determination, from the first result images, whether the first scale level is normal or abnormal; making a second determination, from the second result images, whether the second scale level is normal or abnormal; and determining that no error occurred in the test in response to both the first scale level and the second scale level being determined to be normal; or determining that an error occurred in the test in response to at least one scale level being determined to be abnormal.