The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Dec. 08, 2022
Applicants:

Masato Yoshikawa, Tokyo, JP;

Suguru Sangu, Kanagawa, JP;

Saori Yoshida, Tokyo, JP;

Inventors:

Masato Yoshikawa, Tokyo, JP;

Suguru Sangu, Kanagawa, JP;

Saori Yoshida, Tokyo, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/01 (2006.01);
U.S. Cl.
CPC ...
G06F 3/013 (2013.01);
Abstract

An inclination detector includes: multiple light emitters configured to emit multiple beams to an object: a photosensor having a light-receiving surface; and an output unit. The photosensor is configured to receive the multiple beams reflected from the object on the light-receiving surface and output an electrical signal based on light intensity of the multiple beams received on the light-receiving surface. The output unit configured to output a result of detection of a degree of inclination of the object based on the electrical signal output from the photosensor. The photosensor is disposed at a position at which the light intensity of the multiple beams that are emitted from the multiple light emitters, reflected at the object, and received at the photosensor changes according to the degree of inclination of the object.


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