The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Mar. 23, 2022
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Stefan Christ, Schoeffengrund, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A microscope for microscopic examination of a sample includes an illumination optics for illuminating the sample, an imaging optics for imaging the sample, a sample chamber for receiving the sample. The sample chamber has a door providing access into the sample chamber. The microscope further includes a first fan assembly arranged on a first side of the sample chamber for blowing atmosphere into the sample chamber or for draining atmosphere out of the sample chamber, through at least one first opening arranged on the first side in a first side wall of the sample chamber, and at least one second opening arranged on a second side in a second side wall of the sample chamber for allowing atmosphere from inside the sample chamber to exit the sample chamber or for allowing atmosphere from outside the sample chamber to enter the sample chamber.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile