The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Jun. 30, 2023
Applicant:

Analog Devices, Inc., Wilmington, MA (US);

Inventors:

Ronald A. Kapusta, Carlisle, MA (US);

Andrew William Sparks, Arlington, MA (US);

Harvey Weinberg, Sharon, MA (US);

Assignee:

Analog Devices, Inc., Wilmington, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/481 (2006.01); G01S 7/48 (2006.01); G01S 7/483 (2006.01); G01S 17/58 (2006.01); G01S 17/89 (2020.01); G01S 17/931 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4817 (2013.01); G01S 7/4808 (2013.01); G01S 7/483 (2013.01); G01S 17/58 (2013.01); G01S 17/89 (2013.01); G01S 17/931 (2020.01);
Abstract

A system and method for providing a dynamic region of interest in a lidar system can include scanning a light beam over a field of view to capture a first lidar image, identifying a first object within the captured first lidar image, selecting a first region of interest within the field of view that contains at least a portion of the identified first object, and capturing a second lidar image, where capturing the second lidar image includes scanning the light beam over the first region of interest at a first spatial sampling resolution, and scanning the light beam over the field of view outside of the first region of interest at a second spatial sampling resolution, wherein the second sampling resolution is different the first spatial sampling resolution.


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