The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Apr. 30, 2020
Applicant:

Audi Ag, Ingolstadt, DE;

Inventors:

Markus Klug, Ingolstadt, DE;

Tobias Moll, Ingolstadt, DE;

Johannes Scheuchenpflug, Baar-Ebenhausen, DE;

Assignee:

AUDI AG, Ingolstadt, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/48 (2006.01); G01S 7/481 (2006.01); G01S 17/10 (2020.01); G01S 17/894 (2020.01);
U.S. Cl.
CPC ...
G01S 7/481 (2013.01); G01S 17/10 (2013.01); G01S 17/894 (2020.01);
Abstract

A light source emits light of a predefined wavelength onto a coupling-in region which has a coupling-in diffraction structure and couples the light into a carrier medium in the direction of a measurement region. The measurement region is a combination of an emission diffraction structure and a receiving diffraction structure. The emission diffraction structure extracts light which has been coupled into a measurement volume to be monitored for reflection at an object outside the carrier medium. The receiving diffraction structure couples the reflected light, which is incident on the receiving diffraction structure from outside the carrier medium, into the carrier medium in the direction of a detector region. The detector region has a detector diffraction structure that routes the light onto a detector apparatus. Then the detector apparatus determines a distance to the object from a time of flight of the light from the light source to the detector apparatus.


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