The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
May. 04, 2023
Applicant:
Christos Tsironis, St-Laurent, CA;
Inventor:
Christos Tsironis, Kirkland, CA;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07307 (2013.01);
Abstract
An anti-abrasion wafer probe provides vertical-only probe-tip movement while moved vertically down using the Z-axis of a 3-axis micro-positioner to establish contact with the semiconductor chip on wafer. The vertical-only movement cancels the scratching and abrasion of the chip contact plots, which, in the case of aluminum contact plots, is critical.
Tsironis, Christos. (2026). Anti abrasion wafer probes (U.S. Patent No. 12517152). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12517152
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile