The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Sep. 15, 2022
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Yu-Lin Wang, Tainan, TW;

Guang-Huei Gu, Tainan, TW;

Chih-Jen Chen, Tainan, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G06F 16/29 (2019.01);
U.S. Cl.
CPC ...
G01N 33/0075 (2013.01); G01N 33/0063 (2013.01); G01N 33/0067 (2013.01); G06F 16/29 (2019.01);
Abstract

A fluid quality tracing method includes obtaining pieces of fluid concentration distribution data of a detected region corresponding to detection time points respectively, generating pieces of concentration grid data respectively according to the pieces of fluid concentration distribution data, obtaining pieces of fluid moving data of the detected region corresponding to the detection time points respectively, obtaining estimated positions according to the fluid moving data and an initial position, and creating a fluid concentration trajectory according to the pieces of concentration grid data, the initial position and the estimated positions. The initial position and the estimated positions are located in the detected region. The fluid concentration trajectory includes line segments with terminals corresponding to the initial position and the estimated positions respectively, and the line segments indicate concentration representative values respectively.


Find Patent Forward Citations

Wang, Yu-Lin. (2026). Fluid quality tracing method and system (U.S. Patent No. 12517101). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12517101

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