The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Dec. 15, 2021
Nuctech Company Limited, Beijing, CN;
Tsinghua University, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Lei Liu, Beijing, CN;
Shangmin Sun, Beijing, CN;
Chunguang Zong, Beijing, CN;
Yu Hu, Beijing, CN;
Yuan MA, Beijing, CN;
Zheng Ji, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
TSINGHUA UNIVERSITY, Beijing, CN;
Abstract
The present disclosure provides a radiation inspection system, including a container respectively provided with an entrance and an exit on opposite side walls thereof; and a radiation scanning imaging device disposed in the container and having an inspection channel. The radiation scanning imaging device includes a ray source, the ray source includes ray generators, and ray generators are configured to emit ray beams at different angles, so that the radiation scanning imaging device performs radiation scanning inspection on an object to be inspected passing through the inspection channel from the entrance to the exit.