The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Mar. 30, 2023
Applicant:
Arkray, Inc., Kyoto, JP;
Inventors:
Tsuyoshi Takasu, Kyoto, JP;
Shinya Nakajima, Kyoto, JP;
Assignee:
ARKRAY, Inc., Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/03 (2006.01);
U.S. Cl.
CPC ...
G01N 21/03 (2013.01);
Abstract
A control cuvette used for measurement accuracy control in a measuring apparatus for observing a formed element contained in a liquid sample after precipitating the formed element to a bottom surface of a cuvette, wherein an observation pattern representing a shape of the formed element contained in the liquid sample is provided at an observation surface of the control cuvette corresponding to the bottom surface of the cuvette.
Takasu, Tsuyoshi. (2026). Control cuvette (U.S. Patent No. 12517038). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12517038
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile