The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Feb. 01, 2022
Applicant:

Trioptics Gmbh, Wedel, DE;

Inventors:

Josef Heinisch, Wedel, DE;

Sven Sassning, Wedel, DE;

Aiko Ruprecht, Wedel, DE;

Gabriel Liske, Wedel, DE;

Assignee:

Trioptics GmbH, Wedel, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0292 (2013.01); G01M 11/0207 (2013.01);
Abstract

A measuring apparatus for measuring a modulation transfer function (MTF) of an afocal optical system has a receiving device, a light-providing device, a camera, at least one further light-providing device, at least one further camera, and a transmission interface. In an operational state, the light-providing device, the afocal optical system, and the camera are arranged coaxially on or with measurement axes parallel to a measuring axis oriented perpendicularly to the receiving plane. The further light-providing device, the afocal optical system, and the further camera are arranged coaxially on or with measurement axes parallel to an oblique measuring axis oriented obliquely to the measuring axis. An evaluation unit is configured to identify, using at least one camera image, the modulation transfer function of the afocal optical system.


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