The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Apr. 04, 2024
National Time Service Center, the Chinese Academy of Sciences, Xi'an, CN;
Ruifang Dong, Xi'an, CN;
Zhiguang Xia, Xi'an, CN;
Xiao Xiang, Xi'an, CN;
Run'ai Quan, Xi'an, CN;
Tao Liu, Xi'an, CN;
Shougang Zhang, Xi'an, CN;
Abstract
The present disclosure provides a dispersion measurement device and method based on a Franson second-order quantum interference technology. The device includes: an energy-time entangled twin-photon source configured to generate a plurality of optical signals, where the optical signals each include a signal photon and an idle photon; a polarization splitter configured to split the signal photon and the idle photon, and enable the signal photon to pass through a to-be-measured dispersive medium, such that a correlation time processing module records, under a width of a coincidence measurement integration window, first time of the idle photon arriving at a first single-photon detector, and second time of the signal photon arriving at a second single-photon detector, and obtains a twin-photon conference time width based on the first time and the second time; and a processing module.