The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Aug. 11, 2022
Applicant:

Teledyne Flir Commercial Systems, Inc., Goleta, CA (US);

Inventors:

Julie R. Moreira, Santa Barbara, CA (US);

Theodore R. Hoelter, Santa Barbara, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/80 (2022.01); G06T 7/80 (2017.01); H04N 5/33 (2023.01); H04N 25/53 (2023.01); H04N 25/63 (2023.01); H04N 25/671 (2023.01); G01J 5/00 (2022.01);
U.S. Cl.
CPC ...
G01J 5/80 (2022.01); G06T 7/80 (2017.01); H04N 5/33 (2013.01); H04N 25/53 (2023.01); H04N 25/63 (2023.01); H04N 25/671 (2023.01); G01J 2005/0077 (2013.01); G01J 2005/0092 (2013.01);
Abstract

Techniques for facilitating non-uniformity correction calibrations are provided. In one example, an infrared imaging system includes an infrared imager and a logic device. The infrared imager is configured to capture a first set of infrared images of a reference object using a first integration time. The infrared imager is further configured to capture a second set of infrared images of the reference object using a second integration time different from the first integration time. The logic device is configured to determine a dark current correction map based on the second set of infrared images. The logic device is further configured to generate a non-uniformity correction map based on the dark current correction map. Related devices and methods are also provided.


Find Patent Forward Citations

Loading…