The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Jul. 14, 2022
Applicant:

Bobst Mex SA, Mex, CH;

Inventors:

Thomas Hofmann, Geneva, CH;

Francis Pilloud, Clarens, CH;

Assignee:

BOBST MEX SA, Mex, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41F 33/00 (2006.01); B41F 5/24 (2006.01);
U.S. Cl.
CPC ...
B41F 33/0036 (2013.01); B41F 5/24 (2013.01); B41F 33/0081 (2013.01);
Abstract

The invention relates to an inspection device () for checking the position of at least one coating on a blank () transported through a converting machine (). The inspection device comprising a camera () configured to capture an image of a portion of the blank provided with a reference mark () comprising at least one coating, An optical axis (A) of the camera is arranged at first angle (φ) in relation to a vertical axis (V) defined by a normal vector (N) of a surface of the blank (). An illumination system () is configured to emit incident light rays towards a measuring point (Pm) on the blank. The incident light rays from the illumination system are directed to the reference mark and specular reflected light rays from the reference mark are captured by the camera.


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