The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Apr. 28, 2022
Applicant:

Enpulse Co., Ltd., Chungcheongnam-Do, KR;

Inventors:

Jong Wook Yun, Gyeonggi-do, KR;

Eun Sun Joeng, Gyeonggi-do, KR;

Jangwon Seo, Gyeonggi-do, KR;

Hyeyoung Heo, Gyeonggi-do, KR;

Assignee:

ENPULSE CO., LTD., Chungcheongnam-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 37/24 (2012.01); H01L 21/3105 (2006.01);
U.S. Cl.
CPC ...
B24B 37/24 (2013.01); H01L 21/31053 (2013.01);
Abstract

The present invention relates to a polishing pad for use in a chemical mechanical planarization (CMP) process of semiconductors, to a process for preparing the same, and to a process for preparing a semiconductor device using the same. The polishing pad according to an embodiment can achieve low hardness by comprising a polishing layer formed using a curing agent of specific components. It is possible to enhance the mechanical properties of the polishing pad, as well as to improve the surface defects appearing on the surface of a semiconductor substrate, by controlling the surface roughness reduction rate and the recovery elasticity index of the polishing pad to specific ranges. It is also possible to further enhance the polishing rate.


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