The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Mar. 17, 2021
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Jiahao Pan, Singapore, SG;
Leica Instruments (Singapore) Pte Ltd., Singapore, SG;
Abstract
Examples relate to a system, a method and a computer program controlling a recording device of a surgical microscope system, and to a corresponding surgical microscope system. The system comprises one or more processors and an interface. The system is configured to obtain input data from one or more sensors or actors of the surgical microscope system via the interface. The system is configured to detect a start or an end of a surgery based on the input data. The surgery involves a use of the surgical microscope system. The system is configured to provide a control signal to the recording device of the surgical microscope system via the interface based on the surgery's detected start/end. The input data may be used to detect the start or end of a surgical procedure, which may in turn trigger the activation or deactivation of the recording performed by the recording device.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile