The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

May. 25, 2023
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

Ilan Levin, Alone Abba, IL;

Yaron Hefetz, Kibbutz Alonim, IL;

Avi Bar-Shalev, Haifa, IL;

Avishai Ofan, Rehovot, IL;

Assignee:

GE Precision Healthcare LLC, Wauwatosa, WI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/04 (2006.01); A61B 5/00 (2006.01); A61B 5/107 (2006.01); A61B 6/00 (2024.01); A61B 6/03 (2006.01); A61B 6/42 (2024.01); A61B 6/46 (2024.01); A61B 6/58 (2024.01); G01T 1/164 (2006.01); A61B 6/50 (2024.01); A61B 8/08 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/04 (2013.01); A61B 5/0037 (2013.01); A61B 5/0077 (2013.01); A61B 5/1079 (2013.01); A61B 6/037 (2013.01); A61B 6/0407 (2013.01); A61B 6/4258 (2013.01); A61B 6/4417 (2013.01); A61B 6/461 (2013.01); A61B 6/488 (2013.01); A61B 6/544 (2013.01); A61B 6/58 (2013.01); G01T 1/1644 (2013.01); A61B 6/0487 (2020.08); A61B 6/4266 (2013.01); A61B 6/503 (2013.01); A61B 6/5205 (2013.01); A61B 6/545 (2013.01); A61B 6/547 (2013.01); A61B 6/588 (2013.01); A61B 8/08 (2013.01); G06T 11/005 (2013.01);
Abstract

A medical imaging system is provided. Imaging detector columns are installed in a gantry to receive imaging information about a subject. Imaging detector columns can extend and retract radially as well as be rotated orbitally around the gantry. The system can automatically adjust setup configuration and an imaging operation based on subject shape estimation information.


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