The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Apr. 22, 2025
Applicant:

Sarah Y.y. Aboerjaib, Kuwait, KW;

Inventor:

Sarah Y.Y. Aboerjaib, Kuwait, KW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/05 (2021.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
A61B 5/4064 (2013.01); A61B 5/0075 (2013.01); A61B 5/0082 (2013.01); A61B 5/05 (2013.01); A61B 5/6803 (2013.01); A61B 5/7203 (2013.01); A61B 5/7225 (2013.01); A61B 5/7257 (2013.01); G16H 50/20 (2018.01); A61B 2560/0462 (2013.01); A61B 2562/0233 (2013.01);
Abstract

A method of detecting brain abnormalities in a brain of a patient using backscattered light, the method can include: generating at least one pulsed incident beam of light with at least one light source; directing the at least one pulsed incident beam of light toward a portion of the brain of the patient; applying an RF electromagnetic field toward the portion of the brain of the patient; receiving at least one backscattered beam of light from the portion of the brain of the patient; calculating an insertion loss (I) and an insertion phase difference (I) of the at least one backscattered beam of light; and determining if the patient has a brain abnormality based on the calculated insertion loss and the calculated insertion phase difference.


Find Patent Forward Citations

Aboerjaib, Sarah Y.Y.. (2026). System and method for detecting brain abnormalities using backscattered radiation (U.S. Patent No. 12514487). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12514487

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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