The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Apr. 01, 2022
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Takaaki Saito, Ashigarakami-gun, JP;
Norimasa Shigeta, Ashigarakami-gun, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/05 (2006.01); A61B 1/00 (2006.01); A61B 1/06 (2006.01);
U.S. Cl.
CPC ...
A61B 1/05 (2013.01); A61B 1/00009 (2013.01); A61B 1/00013 (2013.01); A61B 1/0002 (2013.01); A61B 1/00045 (2013.01); A61B 1/00096 (2013.01); A61B 1/0638 (2013.01); A61B 1/0676 (2013.01); A61B 1/0684 (2013.01);
Abstract
An endoscope obtains a plurality of spectral images from the image pickup of an object to be observed illuminated on the basis of illumination light. A special processing section calculates oxygen saturation of the object to be observed on the basis of the plurality of spectral images, first correction parameters that are used to correct differences in the spectral characteristics of the respective semiconductor light sources, and white balance correction data.