The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Oct. 16, 2020
Applicant:

Lenovo (Beijing) Limited, Beijing, CN;

Inventors:

Min Xu, Beijing, CN;

Lianhai Wu, Beijing, CN;

Haiming Wang, Beijing, CN;

Jing Han, Beijing, CN;

Jie Shi, Beijing, CN;

Jie Hu, Beijing, CN;

Ran Yue, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 56/00 (2009.01); H04W 48/10 (2009.01); H04W 52/28 (2009.01);
U.S. Cl.
CPC ...
H04W 56/0045 (2013.01); H04W 48/10 (2013.01); H04W 52/283 (2013.01);
Abstract

The present application relates to a method and an apparatus for determining measurement assistance information. One embodiment of the subject application provides a method performed by a User Equipment (UE), comprising: determining measurement assistance information, wherein the measurement assistance information is used for determining or adjusting one or more measurement windows for one or more neighboring Base Stations (BSs) or one or more neighboring cells; and transmitting the measurement assistance information to a serving BS of the UE; or adjusting the measurement window based on the measurement assistance information.


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