The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Jan. 04, 2024
Government of the United States, As Represented BY the Secretary of the Air Force, Wright-Patterson AFB, OH (US);
Casey Pellizzari, Colorado Springs, CO (US);
Timothy Bate, Colorado Springs, CO (US);
Mark Spencer, Waipahu, HI (US);
United States of America as represented by the Secretary of the Air Force, Wright-Patterson AFB, OH (US);
Abstract
A system and method for measuring the optical phase of incident light using direct detection and for producing speckle-free images, designed for use with coherent illumination and reflective imaging geometries. Applications include speckle mitigation for active imaging, resolution enhancement using synthetic aperture methods, and digitally correcting aberrations in images or refocusing. The system hardware combines pupil-plane phase modulation with dual-plane direct-detection measurements of the image and pupil-plane intensities. The reconstruction software uses a regularized-inversion estimation framework that couples a data-fidelity model, a physics-based model for rough surface scattering of coherent light, and convolutional neural network model for natural images. The regularized inversion framework is solved iteratively using alternating projection.