The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Jan. 24, 2024
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Sebastian Tille, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A device for generating a composite image of a sample includes an illumination unit configured to generate illumination light for illuminating the sample, and an image capture unit configured to generate a first individual image of the sample and a second individual image of the sample. The first individual image corresponds to a first sample region. The second individual image corresponds to a second sample region that is different from the first sample region and overlaps with the first sample region in an overlap region. The device further includes a control unit configured to control the illumination unit in such a way that, when generating each of the first individual image and the second individual image, at least the overlap region is illuminated with a lower intensity of the illumination light than a remaining portion of the first sample region and a remaining portion of the second sample region.