The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
May. 19, 2023
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Hiroto Kano, Tochigi, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/54 (2023.01); G02B 5/00 (2006.01); G02B 27/00 (2006.01); G02B 27/28 (2006.01); G06T 7/00 (2017.01); H04N 23/56 (2023.01); G02B 13/22 (2006.01);
U.S. Cl.
CPC ...
H04N 23/54 (2023.01); G02B 5/005 (2013.01); G02B 27/0093 (2013.01); G02B 27/286 (2013.01); G06T 7/0012 (2013.01); H04N 23/56 (2023.01); G02B 13/22 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/30041 (2013.01);
Abstract
An inspection apparatus configured to detect first light from a first eye of a subject and second light from a second eye of the subject includes an optical system, and an image sensor, wherein the image sensor includes a pixel including a microlens, a first conversion portion, and a second conversion portion, wherein the optical system focuses the first light on the microlens via a first pupil and focuses the second light on the microlens via a second pupil, and wherein the microlens causes the first light to enter the first conversion portion and causes the second light to enter the second conversion portion.