The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Sep. 10, 2024
Hunan University, Changsha, CN;
Hongjin Wang, Changsha, CN;
Yunze He, Changsha, CN;
Xiang Li, Changsha, CN;
Baoyuan Deng, Changsha, CN;
Yaonan Wang, Changsha, CN;
HUNAN UNIVERSITY, Changsha, CN;
Abstract
Provided are a method and apparatus for single-pixel thermal imaging detection of surface and internal defects of a material. The laser module is configured to generate uniform laser light. The spatial light modulation module is configured to spatially encode and modulate received uniform laser light. The projection lens module is configured to project and amplify an encoded light field, and project the encoded light field onto a surface of an object under detection. The optical convergence coupling module is configured to capture and image thermal radiation of the object under detection, and integrate and sum thermal radiation intensities of a projection heating area to obtain a thermal radiation temperature. The thermal infrared single-pixel detector is configured to measure the thermal radiation temperature. The image reconstruction module is configured to sparsely reconstruct data, and finally reconstruct a defect detection result of the projection heating area.