The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Jul. 05, 2024
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventors:

Wei Tang, Beijing, CN;

Rui Zhu, Beijing, CN;

Xingchen Duan, Beijing, CN;

Assignee:

KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/26 (2006.01); H04L 27/00 (2006.01);
U.S. Cl.
CPC ...
H04L 27/266 (2013.01); H04L 27/0014 (2013.01); H04L 2027/0026 (2013.01);
Abstract

To estimate the frequency offset of time domain multi-tone base-band in-phase and quadrature (IQ) data signal, an initial frequency offset is estimated based on a partial frequency-bin offset estimation in the time domain. The estimated initial frequency offset is compensated, and a resultant compensated signal is transformed to the frequency domain. A remaining frequency offset of the compensated signal in the frequency domain is an integer number of unit spacings of a reference multi-tone signal. To determine that number, cross-correlating the magnitudes of the compensated signal in the frequency domain and tones of the reference multi-tone signal is carried out for each of shifted positions of the compensated signal in the frequency domain relative to the reference multi-tone signal to determine a shifted position having a peak cross-correlation, where the shifted position relative to an original position constituting an integer number of frequency-bin offsets.


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