The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Sep. 06, 2023
Applicant:
Viavi Solutions Inc., Chandler, AZ (US);
Inventor:
Wei Chen, Potomac, MD (US);
Assignee:
VIAVI SOLUTIONS INC., Chandler, AZ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/40 (2015.01); G01R 23/20 (2006.01); H04W 16/22 (2009.01);
U.S. Cl.
CPC ...
H04B 17/40 (2015.01); G01R 23/20 (2013.01); H04W 16/22 (2013.01);
Abstract
A test device can be used with an Open Radio Access Network (O-RAN) fronthaul and to test an uplink communication channel for passive intermodulation distortion (PIM). The test device generates and transmits O-RAN compliant messages to request resource blocks (RBs) from an O-RAN radio unit (O-RU) installed at a cell site according to a delay time period. Based on the delay time period, the test device identifies the RBs for an uplink signal to be received by the O-RU on the uplink communication channel at a future time period. The test device requests the RBs and receives the RBs from the O-RU to test for PIM.