The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Dec. 09, 2020
Institut National DE LA Recherche Scientifique, Quebec, CA;
Centre National DE LA Recherche Scientifique (Cnrs, Paris, FR;
INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Quebec, CA;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris, FR;
Abstract
A method and a system for measuring carrier-to-envelope phase fluctuations (CEP) fluctuations of a laser field, the method comprising focusing laser pulses in a solid-state material for high harmonic generation, collecting a resulting high harmonic spectrum, and inferring a relative phase of the driving field from the high harmonic spectrum. The system comprises a source of CEP stable mid-infrared laser pulses; a CEP variation unit; a solid state medium; a detector; and first focusing optics focusing pulses generated by the source into the solid state medium and second focusing optics collecting resulting harmonics generated in the solid state medium into the detector.