The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Aug. 24, 2023
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Richard W. Ely, Lewisville, TX (US);

Jody D. Verret, Rockwall, TX (US);

Assignee:

Raytheon Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 17/05 (2011.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
G06T 17/05 (2013.01); G06V 10/761 (2022.01);
Abstract

Devices, systems, and methods for three-dimensional (3D) evaluation point (3DEP) identification; wherein a method can include receiving a first conjugate point of a first real two-dimensional (2D) image, receiving a second conjugate point of a second real 2D image, the first and second conjugate points corresponding to a same geographical location, determining a first set of points of a 3D point set that project to within a specified distance of the first conjugate point in the first real 2D image, determining a second set of points of the 3D point set that project to within the specified distance of the second conjugate point in the second real 2D image, identifying a common point in both the first set of points and the second set of points that satisfies a specified heuristic relative to all other points in both the first set of points and the second set of points, and using the point as the 3DEP.


Find Patent Forward Citations

Loading…