The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Jul. 13, 2023
Applicant:

Hong Kong Centre for Logistics Robotics Limited, Hong Kong, CN;

Inventors:

Ben M. Chen, Hong Kong, CN;

Guidong Yang, Hong Kong, CN;

Chuanxiang Gao, Hong Kong, CN;

Xi Chen, Hong Kong, CN;

Jihan Zhang, Hong Kong, CN;

Benyun Zhao, Hong Kong, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/593 (2017.01); G06T 3/18 (2024.01); G06T 7/55 (2017.01); G06T 7/579 (2017.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
G06T 7/593 (2017.01); G06T 3/18 (2024.01); G06T 7/55 (2017.01); G06T 7/579 (2017.01); G06T 7/62 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20216 (2013.01); G06T 2207/20221 (2013.01);
Abstract

A deep learning network can perform three-dimensional (3D) image reconstruction of a scene from multi-view calibrated two-dimensional (2D) images. The network can include a convolutional neural network that performs feature extraction to generate feature pyramids corresponding to features at different levels of resolution. The feature pyramids can be used to compute a respective cost volume for each feature pyramid at each level of resolution, with the cost volume incorporating a learnable parameter that corresponds to a weight allocated to the 'reference' feature pyramid relative to other feature pyramids. A depth map for each input image can be generated based at least in part on the cost volume.


Find Patent Forward Citations

Quick Actions:

Chen, Ben. (2025). Multi-view stereo with learnable cost metric for 3d reconstruction (U.S. Patent No. 12511767). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12511767

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…