The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Oct. 13, 2022
Applicant:

Alibaba (China) Co., Ltd., Hangzhou, CN;

Inventors:

Jiawen Yao, Beijing, CN;

Yingda Xia, North Bethesda, MD (US);

Ke Yan, Beijing, CN;

Dakai Jin, Laurel, MD (US);

Xiansheng Hua, Zhejiang, CN;

Le Lu, Bethesda, MD (US);

Ling Zhang, Rockville, MD (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/10 (2017.01); G06T 7/73 (2017.01); G06V 20/70 (2022.01);
U.S. Cl.
CPC ...
G06T 7/10 (2017.01); G06T 7/73 (2017.01); G06V 20/70 (2022.01); G06T 2207/10081 (2013.01); G06T 2207/20084 (2013.01); G06V 2201/031 (2022.01);
Abstract

An image processing method is provided. The method includes obtaining a to-be-processed image comprising a target object, and inputting the to-be-processed image to a convolutional layer of an image processing model, to obtain an initial feature map of the to-be-processed image, wherein the image processing model comprises an encoder and a decoder; inputting the initial feature map to a self-attention mechanism layer of the encoder, and obtaining a target feature map corresponding to the initial feature map according to position information of each feature in the initial feature map and a position relationship between the each feature and other features; and inputting the target feature map to the decoder for processing, to obtain an object segmentation map and an object label of the target object in the to-be-processed image.


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