The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Nov. 23, 2021
Applicant:
Fujifilm Healthcare Corporation, Kashiwa, JP;
Inventors:
Tomoki Amemiya, Chiba, JP;
Atsuro Suzuki, Chiba, JP;
Yukio Kaneko, Chiba, JP;
Chizue Tanaka, Chiba, JP;
Toru Shirai, Chiba, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/50 (2006.01); G06N 3/08 (2023.01); G06T 5/80 (2024.01);
U.S. Cl.
CPC ...
G06T 5/80 (2024.01); G06N 3/08 (2013.01); G06T 5/50 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract
A learning model learned to provide high image quality of a first image is generated. A first image and a second image are received from the same target, high image quality of the first image is provided by using the learned model, and a first high image quality image is obtained. By using the first high image quality image and the second image as inputs, a high image quality image of the second image having the image quality of the first high image quality image is generated while maintaining contrast of the second image.