The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Mar. 23, 2021
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Naoto Takano, Tokyo, JP;

Hyakka Nakada, Tokyo, JP;

Takeshi Ohmori, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/245 (2019.01); G06F 16/22 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/22 (2019.01); G06F 16/245 (2019.01);
Abstract

Target processing conditions are searched while reducing a process development time and process development costs. A processing condition search device includes a learning database including a processing database storing target processing data for a target process and a reference processing database storing reference processing data for a reference process, a teachered learning execution unit that estimates an I/O model of the target process, which is an I/O model between a target description variable and a target objective variable, a transfer learning execution unit that estimates the I/O model of the target process using a reference I/O mode between a reference description variable and a reference objective variable, and the target processing data, and a transferability determination unit that determines whether the teachered learning execution unit or the transfer learning execution unit is used to estimate the I/O model of the target process.


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