The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Jul. 08, 2021
Oracle International Corporation, Redwood Shores, CA (US);
Madalasa Venkataraman, Bengaluru, IN;
Paul Deepakraj Retinraj, Fremont, CA (US);
Dinesh Ghanta, Bengaluru, IN;
Girish Nautiyal, Bengaluru, IN;
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
For at least a selected class attribute of the multiple class attributes, one or more bias metrics are determined that estimate a degree to which a particular workflow (having a set of processing stages) is biased in association with the class attribute. Each user of a set of users is associated with a set of user data to be processed by the particular workflow. At least one of the set of processing stages includes executing a machine-learning model. It can be detected that a bias-mitigation option corresponding to a specific class attribute has been selected. For each of at least two of the set of processing stages: a de-biasing technique is selected; and the processing stage is modified by applying the de-biasing technique. A modified version of the particular workflow (which includes the modified processing stages) is applied to each of a set of input data sets.