The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Jan. 03, 2023
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Melissa Podrazka, Chicago, IL (US);

Justin Horowitz, Fort Mill, SC (US);

Assignee:

Bank of America Corporation, Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2023.01); G06F 18/21 (2023.01); G06F 18/214 (2023.01); G06F 18/22 (2023.01); G06N 3/045 (2023.01); G06N 3/09 (2023.01);
U.S. Cl.
CPC ...
G06N 3/04 (2013.01); G06F 18/2155 (2023.01); G06F 18/217 (2023.01); G06F 18/22 (2023.01); G06N 3/045 (2023.01); G06N 3/09 (2023.01);
Abstract

A method for candidate data points selection for labeling unlabeled data points is provided. The method may include inputting a first data point to an auditable neural network. The method may include predicting, using the network, a label for the first data point. The method may include deconstructing, based on a simplicial structure, the first data point into a plurality of component parts of the first data point. The method may include reconstructing, the first data point into a reconstructed first data point, based on the simplicial structure, using the plurality of component parts and the label. The method may include generating a reconstruction error value based on a reconstruction error algorithm that compares the first data point to the reconstructed first data point. The method may include quarantining the first data point within the auditable neural network when the reconstruction error value is above a threshold reconstruction error value.


Find Patent Forward Citations

Podrazka, Melissa. (2025). Candidate data points selection system for labeling unlabeled data points (U.S. Patent No. 12511519). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12511519

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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