Near-threshold cell circuit delay model

Abstract

Disclosed is a near-threshold cell circuit delay model, where obtaining parameters includes obtaining process parameters, current parameters and delay parameters with slow input transition; judging a cell circuit type includes judging whether a cell circuit is an inverter, a stacked structure cell or a parallel structure cell, calculating currents and a current integral according to the cell circuit type, calculating a mean value, a variance and a skewness of a logarithm of the current sum, and calculating a mean value and a variance of an equivalent threshold voltage; judging a delay type includes calculating an overshoot time and a delay according to the cell circuit type, comparing the magnitude relationship among an input transition time, the overshoot time and the delay, and judging whether the delay type is ultra-fast input, fast input or slow input; establishing a cell circuit nominal delay model is establishing the cell circuit nominal delay model according to the cell circuit type and the delay type, and obtaining a nominal delay value; and establishing a cell circuit statistical delay model is establishing the cell circuit statistical delay model according to the cell circuit type and the delay type.