The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Oct. 05, 2022
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Yongdae Kim, Daejeon, KR;

Cheoljun Park, Daejeon, KR;

Sangwook Bae, Daejeon, KR;

Beomseok Oh, Daejeon, KR;

Jiho Lee, Daejeon, KR;

Mincheol Son, Daejeon, KR;

Insu Yun, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 2221/034 (2013.01);
Abstract

Disclosed are a negative testing-based security analysis system for protocol implementation of an LTE device, and a method thereof. According to an embodiment, a negative testing-based security analyzing method for protocol implementation of an LTE device performed by a computer device includes redefining a state of user equipment (UE) as a security abstraction state for a negative test and composing a test case generation rule by analyzing a specification document in redefining the state of the UE as the security abstraction state.


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