The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Oct. 26, 2021
Applicant:

Telefonaktiebolaget Lm Ericsson (Publ), Stockholm, SE;

Inventors:

Mario Mansour, Åkersberga, SE;

Gabriel Hjort Akerlund, Vallentuna, SE;

Andreas Ermedahl, Spånga, SE;

Per Karlsson, Älvsjö, SE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 17/18 (2006.01); G06F 18/232 (2023.01); H04L 41/0823 (2022.01); H04L 41/14 (2022.01); H04W 24/02 (2009.01);
U.S. Cl.
CPC ...
G06F 18/232 (2023.01); G06F 17/18 (2013.01); H04L 41/0823 (2013.01); H04L 41/145 (2013.01); H04W 24/02 (2013.01);
Abstract

In one aspect, a computer-implemented method for recommending an optimal configuration for a target system is provided. The method includes obtaining a plurality of samples, wherein each sample corresponds to a system configuration. The method includes extracting, from each of the plurality of samples, a plurality of features. The method includes grouping the plurality of samples into one or more clusters, wherein each cluster comprises a set of one or more samples. The method includes calculating, for each respective cluster of the one or more clusters, one or more metrics for each extracted feature based on the set of one or more samples in the respective cluster. The method includes calculating, for each respective cluster of the one or more clusters, a weight for each extracted feature based on the calculated one or more metrics for each extracted feature. The method includes obtaining a set of one or more requirements for a target system. The method includes determining an optimal configuration for the target system based on the calculated weights for each cluster and the set of one or more requirements.


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