The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

May. 25, 2023
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Shuichi Nishino, Tokyo, JP;

Yutaka Uematsu, Tokyo, JP;

Tadanobu Toba, Tokyo, JP;

Kenichi Shimbo, Tokyo, JP;

Takumi Uezono, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/0706 (2013.01); G06F 11/0721 (2013.01); G06F 11/2257 (2013.01);
Abstract

A processor system includes: one or more processors; and one or more memory resources. The memory resource is configured to store a diagnostic program configured to diagnose an electronic system including a mobile body or equipment, and a plurality of knowledge graphs for use in the diagnostic program and including at least a first knowledge graph and a second knowledge graph created based on domain knowledge different from that of the first knowledge graph. The processor is configured to execute the diagnostic program to (1) evaluate a semantic similarity between a first knowledge item included in the first knowledge graph and a second knowledge item included in the second knowledge graph, and (2) generate, when the similarity satisfies a predetermined condition, an integrated graph in which the first knowledge graph and the second knowledge graph are integrated.


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