The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Feb. 12, 2024
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Gabriel-Roberto Dias, Wetzlar, DE;

Patric Pelzer, Wetzlar, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G06F 3/04842 (2022.01); G06F 3/04845 (2022.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G06F 3/04842 (2013.01); G06F 3/04845 (2013.01); G06F 2203/04806 (2013.01);
Abstract

A computer system for displaying sample images includes one or more processors configured to receive at least one sample image, each of the at least one sample images having been obtained by imaging a sample located in or on a sample holder using a microscope according to an imaging process; receive or generate spatial context information regarding the at least one sample image, the spatial context information having reference to the imaging process for obtaining the at least one sample image; and control a display to display the at least one sample image on the display based on the spatial context information regarding the at least one sample images.


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