The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
May. 23, 2022
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Christian Schumann, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A method for examining a sample containing a target fluorophore j using a fluorescence microscope includes acquiring a series of sample images over an acquisition time interval, and adjusting an illumination parameter Pin a plurality of iteration steps n during the acquisition time interval to different set values. The series of sample images are acquired after adjusting the illumination parameter Pin at least some of the plurality of iteration steps n. The method further includes determining a bleaching behaviour descriptor κindicative of a bleaching behaviour of the target fluorophore j and a fluorescence response descriptor Iindicative of a fluorescence response of the target fluorophore j for the set values of the illumination parameter P. The illumination parameter Pis adjusted based on the bleaching behaviour descriptor κand the fluorescence response descriptor Ias determined in a preceding one of the plurality of iteration steps n.