The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Jun. 11, 2020
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Tatsuo Hariyama, Tokyo, JP;

Masahiro Watanabe, Tokyo, JP;

Atsushi Taniguchi, Tokyo, JP;

Kenji Maruno, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 17/08 (2006.01); G01B 9/02017 (2022.01);
U.S. Cl.
CPC ...
G01S 17/08 (2013.01); G01B 9/02017 (2013.01);
Abstract

According to the present invention, a measured distance is corrected in accordance with change in the surrounding environment. A distance measurement system includes: a first light-receiving unit configured to irradiate an object with one part of a split light beam as assessment light, and receive light reflected by the object to detect a target assessment beat signal; a second light-receiving unit configured to guide the other part of the split light beam as reference light to a reference optical path serving as a distance reference, and receive the reference light that has passed through the reference optical path to detect a reference optical path assessment beat signal; a distance measurement unit configured to measure a distance to the object on the basis of the target assessment beat signal and the reference optical path assessment beat signal; a temperature sensor configured to assess a temperature in the periphery of the reference optical path; and a correction unit configured to correct the measured distance on the basis of the assessed temperature.


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