The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
May. 25, 2018
Pva Tepla Analytical Systems Gmbh, Westhausen, DE;
Peter Hoffrogge, Oberkochen, DE;
Martin Böckler, Wettringen, DE;
Mario Lowack, Neuburg an der Kammel, DE;
Matthias Koch, Aalen, DE;
Martin Hinderer, Schwäbisch Hall, DE;
Markus Herrmann, Hüttlingen, DE;
Tatjana Djuric-Rissner, Aalen, DE;
Zyzi Ramos, Aalen, DE;
PVA TEPLA ANALYTICAL SYSTEMS GMBH, Westhausen, DE;
Abstract
The invention relates to an ultrasonic microscope for inspecting an object, comprising an object holder for holding the object in an object region; a scan head; a first transducer supported by the scan head and configured to emit first acoustic pulses along an emission direction, to focus the first acoustic pulses in a focal point, to detect second acoustic pulses emerging from the object and to output a first detection signal representing the second acoustic pulses detected by the first transducer; a first actuator configured to move the first transducer relative to the scan head along a vertical direction which is essentially parallel to the emission direction; and a controller configured to control the first actuator based on the first detection signal. Further, the invention relates to a carrier for carrying an acoustic pulse transducer of an ultrasonic microscope within an immersion liquid.