The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Feb. 18, 2022
Applicant:

Exaddon Ag, Buchberg, CH;

Inventors:

Kun-Hsien Lin, Zhubei, TW;

Edgar Hepp, Zurich, CH;

Wabe Koelmans, Adliswil, CH;

Patrik Schuerch, Suhr, CH;

Assignee:

EXADDON AG, Buchberg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/00 (2006.01); B33Y 10/00 (2015.01); B33Y 80/00 (2015.01); C25D 1/00 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01);
U.S. Cl.
CPC ...
G01R 3/00 (2013.01); B33Y 10/00 (2014.12); B33Y 80/00 (2014.12); G01R 1/06716 (2013.01); G01R 1/06738 (2013.01); G01R 1/06761 (2013.01); G01R 1/07307 (2013.01); G01R 1/07342 (2013.01); C25D 1/003 (2013.01); G01R 1/06733 (2013.01); G01R 1/06755 (2013.01); G01R 1/07314 (2013.01);
Abstract

A method for producing a probe card comprises the steps of: providing a carrier board, wherein a surface of the carrier board has at least one probe guiding portion; and generating a probe on the probe guiding portion by performing additive manufacturing with a conductive material directly on the at least one probe guiding portion to generate the probe, wherein the additive manufacturing comprises directly layering the conductive material on the probe guiding portion.


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