The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
May. 06, 2021
Shimadzu Corporation, Kyoto, JP;
Masahito Yahata, Kyoto, JP;
Kazuma Maeda, Kyoto, JP;
Tatsuya Kataoka, Kyoto, JP;
Yuichi Masuda, Kyoto, JP;
Nobuhiro Namikawa, Kyoto, JP;
Akioki Nakamori, Kyoto, JP;
Tatsuya Iwama, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
An inspection apparatus includes a measurement unit, a flow-in tube for flow of sample water into the measurement unit, a connection portion that connects a sample tube and the measurement unit to each other, a liquid sending portion that sends sample water to the measurement unit, a pressurization pump that increases a pressure in the inside of the sample tube, and a controller. The controller controls operations of the liquid sending portion and the pressurization pump to suppress within a prescribed range, variation in pressure applied to sample water until sample water reaches the measurement unit from the inside of the sample tube.