The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Jan. 19, 2022
Nederlandse Organisatie Voor Toegepast-natuurwetenschappelijk Onderzoek Tno, 's-Gravenhage, NL;
Paul Louis Maria Joseph Van Neer, Bergschenhoek, NL;
Maurits Sebastiaan Van Der Heiden, 's-Gravenhage, NL;
Michiel Peter Oderwald, Delft, NL;
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO, s-Gravenhage, NL;
Abstract
An acoustic microscope system is described that includes a container for holding a medium with an object to be measured. Compressional waves are generated by a probe into the medium. The compressional waves travel along an acoustic axis to interact with the object. Shear waves are generated by a shear wave source into the medium. The shear waves travel along a secondary axis which intersects with the acoustic axis at the object with a non-zero angle. The shear waves are configured to cause shear wave oscillations directed transverse to the secondary axis and at least partially directed along the acoustic axis. A measurement of the object is determined based on the compressional waves having interacted with the object as a function of the generation of the shear waves.