The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Jul. 27, 2021
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Takashi Anazawa, Tokyo, JP;

Motohiro Yamazaki, Tokyo, JP;

Ryoji Inaba, Tokyo, JP;

Shuhei Yamamoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/447 (2006.01);
U.S. Cl.
CPC ...
G01N 27/44782 (2013.01); G01N 27/44721 (2013.01);
Abstract

In an instrument configured to spectroscopically divide fluorescences emitted from a plurality of capillaries and collectively measure the fluorescences using an image sensor, when the number of pixels of a binning region on the image sensor on which a predetermined wavelength-band component of each fluorescence is projected is denoted by B, the number of pixels of hardware binning is denoted by B, the number of pixels of software binning is denoted by B, B=B×B, the total noise measured in a case where B=B=B=1 is denoted by N, the readout noise is denoted by N, the dark-current noise is denoted by N, and the shot noise is denoted by N, B, B, B, N, N, N, and Nsatisfy a predetermined relationship, thereby realizing high sensitivity and high dynamic range in fluorescence measurement.


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