The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Dec. 28, 2023
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Jérôme Le Perchec, Grenoble, FR;

Mathieu Dupoy, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); H04N 23/55 (2023.01);
U.S. Cl.
CPC ...
G01N 21/35 (2013.01); H04N 23/55 (2023.01);
Abstract

A device for observing a sample includes a light source; an image sensor, comprising several pixels; and a microlens array comprising several convergent microlenses, each: microlens being disposed facing a pixel, each microlens comprising an image focus, each microlens being configured to form, from light waves being propagated in parallel incidence, a light wave beam converging towards the image focus of said microlens. The device is configured to hold the sample between the light source and the plurality of microlenses. The device includes several attenuating elements each attenuating element being associated with a microlens and with a pixel, each attenuating element being configured to attenuate the light waves converging towards the image focus of the lens with which it is associated.


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