The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Jul. 27, 2022
Canon Kabushiki Kaisha, Tokyo, JP;
Wataru Yamaguchi, Tochigi, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A measuring device for measuring a position of a pattern includes a wavelength variable unit configured to vary a spectrum of first light in accordance with an incident position at which the first light is incident to allow the first light to pass therethrough, and a moving unit configured to change the incident position by moving the wavelength variable unit. The wavelength variable unit is moved to a position based on wavelength characteristic information and intensity characteristic information, the wavelength characteristic information indicating a relationship between the position of the wavelength variable unit and a wavelength of the first light transmitted through the wavelength variable unit, the intensity characteristic information indicating a relationship between the position of the wavelength variable unit and an intensity of second light from the pattern illuminated with the first light transmitted through the wavelength variable unit.