The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 2025

Filed:

Jan. 26, 2022
Applicants:

Uby, Paris, FR;

Ellona, Toulouse, FR;

Inventors:

Laurent Mareuge, Marly le Roi, FR;

Ivan Romanytsia, Toulouse, FR;

Assignees:

UBY, Paris, FR;

ELLONA, Toulouse, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/075 (2024.01); G01N 21/94 (2006.01); G01N 35/00 (2006.01); G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
G01N 15/075 (2024.01); G01N 21/94 (2013.01); G01N 35/00722 (2013.01); G01N 2015/0046 (2013.01); G01N 2035/009 (2013.01); G01N 2201/0221 (2013.01);
Abstract

This disclosure describes a method for determining, in real time and continuously, an amount of particles of a given material in a sample, including steps of: E1: optically measuring a signature of the sample by an optical sensor; E2: identifying, by a processing unit, the type of the sample by a classification model trained on a training database including a plurality of reference signatures, each reference signature being associated with a reference sample type; and E3: determining, by the processing unit, the amount of particles of the given material in the sample based on the identified sample type and a correspondence table associating, with each of a plurality of reference sample types, a reference amount of particles of the given material.


Find Patent Forward Citations

Loading…