The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Apr. 26, 2023
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Purdue Research Foundation, West Lafayette, IN (US);
Shelby Hutchens, Champaign, IL (US);
Amy Jaye Wagoner Johnson, Champaign, IL (US);
Jing-Chen Peng, Vancouver, WA (US);
Matthew Guerena, San Diego, CA (US);
Marcus Schmid, Rantoul, IL;
Cecilia Walsh, Western Springs, IL (US);
Tyler Jacob Roberts, Aurora, IL (US);
Chelsea Simone Davis, West Lafayette, IN (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Purdue Research Foundation, West Lafayette, IN (US);
Abstract
A microscope mounting system includes a sample holder shaped and configured to fit a particular horizontal microscope stage and fix one end of a soft material sample. A blade holder configured to position a cutting blade and connect directly or eventually to the particular microscope or a frame of the particular microscope. A load measurement device is configured to determine a load applied to the cutting blade. A precision adjustment assembly sets positioning of the cutting blade in the horizontal x-y plane and the z vertical plane such that a cutting edge of the cutting blade can be positioned at a focal point of the particular microscope. At least two grips are configured to grip a second end of the soft material sample at at least two discrete locations on opposite sides of the cutting blade when the blade contacts the soft material sample at the focal point. A tension mechanism can apply tension in the x-y plane to each of the at least two grips.